Shock Ignition and Growth of HMX-based PBXs under Different Temperature Conditions
Rui Liu, Yong Han, Ming Li, Zhihai Jiang, Songwei He
Słowa Kluczowe: shock ignition and growth, Lagrange test, HMX-based PBXs, high temperatures, Lee-Tarver mode
DOI: 10.22211/cejem/104390
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