Thermally Induced Damage in Hexanitrohexaazaisowurtzitane

Qiang TIAN, Guanyun YAN, Guangai SUN, Chaoqiang HUANG, Lei XIE, Bo CHEN, Ming HUANG, Hongzhen LI, Yi LIU and Jie WANG
Słowa Kluczowe: CL-20, SAXS, AFM, thermal effects, voids
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Michał Gańko